Anritsu MP1764C 50 MHz to 12.5 GHz Error Detector

The MP1763C is used in combination with the MP1764C or MP1764D Error Detector for 12.5G BER testing. The amplitude of the clock and data signals can be varied from 0.25 to 2 Vp-p while the offset can be adjusted to within ±2 V so that the amplitude and the offset margin can be measured. The clock has a variable delay function so that time dependent characteristics or phase margins of the input clock and data can be measured. An M-series pseudorandom pattern resentative of actual conditions or a programmable pattern can be selected as cell data.1/8 parallel output is standard, and options are available for either 1/4 parallel output or 1/4 differential output. This is the only 12.5G BERT system with differential inputs and Ľ differential outputs required for SAN market device applications.

In addition, a 3.5 inch floppy disk drive is built in for storing preset data, enabling rapid measurements to be performed by simply pressing a key. A GPIB function is provided, enabling automatic or remote measurement via an external controller.

The MP1763C pulse pattern generator is ideal for research and development of high-speed logic, ICs, and digital systems.

Features:

High quality waveform
Wide frequency range covers STM 0/STS1 to 10 GbE, STM64/STS192, OUT-2, and 4.25G Fibre Channel
Low FM/PM-noise clock generator
1/8 parallel output standard, with available options for either 1/4 parallel output or 1/4 differential output
8 Mbit programmable pattern corresponding to six frames of STM-64/ STS-192
Complementary outputs of both data and clock
The amplitudes and offsets of all 8 data outputs that have 1/8 speed of fundamental clock signal can be set

">

Test equipment Connection, Worldwide test equipment sales

ANRITSU MP1764C

Anritsu MP1764C 50 MHz to 12.5 GHz Error Detector
The MP1763C is used in combination with the MP1764C or MP1764D Error Detector for 12.5G BER testing. The amplitude of the clock and data signals can be varied from 0.25 to 2 Vp-p while the offset can be adjusted to within ±2 V so that the amplitude and the offset margin can be measured. The clock has a variable delay function so that time dependent characteristics or phase margins of the input clock and data can be measured. An M-series pseudorandom pattern resentative of actual conditions or a programmable pattern can be selected as cell data.1/8 parallel output is standard, and options are available for either 1/4 parallel output or 1/4 differential output. This is the only 12.5G BERT system with differential inputs and Ľ differential outputs required for SAN market device applications.
In addition, a 3.5 inch floppy disk drive is built in for storing preset data, enabling rapid measurements to be performed by simply pressing a key. A GPIB function is provided, enabling automatic or remote measurement via an external controller.
The MP1763C pulse pattern generator is ideal for research and development of high-speed logic, ICs, and digital systems.

Features:
High quality waveform
Wide frequency range covers STM 0/STS1 to 10 GbE, STM64/STS192, OUT-2, and 4.25G Fibre Channel
Low FM/PM-noise clock generator
1/8 parallel output standard, with available options for either 1/4 parallel output or 1/4 differential output
8 Mbit programmable pattern corresponding to six frames of STM-64/ STS-192
Complementary outputs of both data and clock
The amplitudes and offsets of all 8 data outputs that have 1/8 speed of fundamental clock signal can be set

Test Equipment Connection is the leading dealer of reconditioned test & measurement equipment. We buy and sell bench top, general-purpose test and measurement equipment. We can save you Between 30 - 70 Off of the new list prices. Test equipment connection Rents, Leases, Buys, Sells, and Repairs the largest variety of equipment in the industry.

Click here for a quote on the ANRITSU MP1764C